Qtec Technologies Sdn Bhd Website 2016 created by EMC Marketing

Semiconductor/IC Test Solution
SoC Test System

SoC/Analog Test System 
Model 3650-EX 

  1. Application coverage: MCU w ADDA/Memory, Controller, PMIC, and all sorts of consumer

  2. Expandable platform with up to 1024 IO channels and 96 DPS

  3. 50/100 MHz, 200 MHz (MUX) Test Rate

Programmable Pin Electronics Module Model 36010

  1. 100 MHz maximum test rate

  2. Scalable architecture to provide up to 64 pins

  3. Per Pin TMU, TMU, and level/timing setting

  4. 32M vector memory, with scan support

SoC/Analog Test System 
Model 3650
 

  1. Application coverage: MCU w ADDA/Memory, Controller, PMIC, and all sorts of consumer

  2. Expandable platform with up to 640 channels

  3. 50/100 MHz, 200 MHz (MUX) Test Rate

SoC/Analog Test System 
Model 3650-CX

  1. Application coverage: MCU w ADDA/Memory, Controller, PMIC, and all sorts of consumer

  2. Expandable platform with up to 256 channels

  3. 50/100 MHz, 200 MHz (MUX) Test Rate

DUT Power Supply 
Model 36020

  1. 4 Channels in standard PXI 3U/PXIe-Hybird compatible bus type

  2. +5/-2V and +10V/-2V force ranges

  3. 16-bits VF and 18-bits IM resolution

  4. 6 selectable ranges from 5uA to 250mA, with ganged function support

VLSI Test System

VLSI Test System 
Model 3380

  1. 100Mhz clock rate, 1024 I/O channels (Max to 1280 pins)

  2. Up to 1024 sites Parallel testing

  3. Various VI source

  4. Flexible Architectures: Slot interchangeable I/O, ADDA, VI source

VLSI Test System 
Model 3360-D

  1. 50 Mhz clock rate,64 I/O channels

  2. Up to 8 sites Parallel testing

  3. Support full rang AC Inlet & Small footprint

  4. Flexible Architectures: Slot interchangeable I/O, ADDA, VI option Your Dream Platform for Various Types of Devices.

VLSI Test System 
Model 3380-P

  1. 100Mhz clock rate, 512 I/O channels (Max to 576 pins)

  2. Up to 512 sites Parallel testing

  3. Various VI source

  4. Flexible Architectures: Slot interchangeable I/O, ADDA, VI source

VLSI Test System 
Model 3360-P

  1. 50 Mhz clock rate, 256 I/O channels

  2. Up to 32 sites Parallel testing

  3. Support ADDA, Mixed-signal , LCD …etc option card

  4. Flexible Architectures: Slot interchangeable I/O, ADDA, UVI, HVREF …etc option

VLSI Test System 
Model 3380-D

  1. 100 MHz clock rate,256 I/O digital I/O pins

  2. Up to 256 sites Parallel testing

  3. Various VI source

  4. Flexible HW-architecture (Interchangeable I/O, VI, ADDA,)

VLSI Test System 
Model 3360

  1. 50 Mhz clock rate, 512 I/O channels (Max to 608 pins)

  2. Up to 64 sites Parallel testing

  3. Support HI-voltage VI & LCD option card

  4. Flexible Architectures: Slot interchangeable I/O, ADDA, VI option

High Speed PXIe Digital IO Card Model 33010

  1. Standard PXIe bus type

  2. 100MHz maximum clock ate

  3. 32 channels per board

  4. Extendable to maximum 256 channels in one segment

Need more details? Contact us

We are here to assist. Contact us by phone or email .